Authors:Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen,
Publisher: Morgan Kaufmann
Keywords: testability, systems, silicon, design, architectures, test, principles, vlsi
Number of Pages: 808
Published: 2006-07-21
List price: $77.95
ISBN-10: 0123705975
ISBN-13: 9780123705976

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.· Lecture slides and exercise solutions for all c

Authors:Rajesh Garg, Sunil P. Khatri,
Publisher: Springer
Keywords: soft, errors, process, variations, mitigating, circuits, design, resilient, vlsi, analysis
Number of Pages: 212
Published: 1970-01-01
List price: $129.00
ISBN-10: 1441909303
ISBN-13: 9781441909305

This book describes the design of resilient VLSI circuits. VLSI design has become more challenging recently, due to the detrimental effects of radiation particle strikes and processing variations. This book presents algorithms to analyze the effects of these issues on the electrical behavior of VLSI circuits and circuit design techniques to mitigate the impact of these problems.

Authors:Howard Huff, David Gilmer,
Publisher: Springer
Keywords: springer, series, advanced, microelectronics, applications, mosfet, constant, materials, vlsi, dielectric
Number of Pages: 710
Published: 2004-12-03
List price: $299.00
ISBN-10: 3540210814
ISBN-13: 9783540210818

Issues relating to the high-K gate dielectric are among the greatest challenges for the evolving International Technology Roadmap for Semiconductors (ITRS). More than just an historical overview, this book will assess previous and present approachs related to scaling the gate dielectric and their impact, along with the creative directions and forthcoming challenges that will define the future of gate dielectric scaling technology. Topics include: the classical regime for SiO2 gate dielectrics; the transition to silicon oxynitride gate dielectrics; the transition to high-K gate dielectrics (inc

Authors:Carver Mead, Mohammed Ismail,
Publisher: Springer
Keywords: series, engineering, computer, science, international, springer, vlsi, implementation, neural, systems, analog
Number of Pages: 264
Published: 1989-08-31
List price: $175.00
ISBN-10: 0792390407
ISBN-13: 9780792390404

Author: Wayne Wolf
Publisher: Prentice Hall PTR
Keywords: design, based, vlsi, modern
Number of Pages: 656
Published: 2008-12-31
List price: $104.00
ISBN-10: 0137145004
ISBN-13: 9780137145003

The Number 1 VLSI Design Guide—Now Fully Updated for IP-Based Design and the Newest TechnologiesModern VLSI Design, Fourth Edition, offers authoritative, up-to-the-minute guidance for the entire VLSI design process—from architecture and logic design through layout and packaging. Wayne Wolf has systematically updated his award-winning book for today’s newest technologies and highest-value design techniques. Wolf introduces powerful new IP-based design techniques at all three levels: gates, subsystems, and architecture. He presents deeper coverage of logic design fundamentals, clocking

Author: On-Line Monitoring of Reliability Indicators. 4.1.
Publisher: Springer
Keywords: vlsi, testing, line
Number of Pages: 164
Published: 1998-04-30
List price: $149.00
ISBN-10: 0792381327
ISBN-13: 9780792381327

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced

Author: Wai-Kai Che
Publisher: CRC Pre
Keywords: circuits, handbook, filters, analog, vlsi
Number of Pages: 702
Published: 2009-06-23
List price: $99.95
ISBN-10: 1420058916
ISBN-13: 9781420058918

Featuring hundreds of illustrations and references, this volume in the third edition of the Circuits and Filters Handbook, provides the latest information on analog and VLSI circuits, omitting extensive theory and proofs in favor of numerous examples throughout each chapter. The first part of the text focuses on analog integrated circuits, presenting up-to-date knowledge on monolithic device models, analog circuit cells, high performance analog circuits, RF communication circuits, and PLL circuits. In the second half of the book, well-known contributors offer the latest findings on VLSI circui