Author: Adam Osseiran
Publisher: Springer
Keywords: standard, test, frontiers, electronic, testing, ieee, guide, mixed, signal, boundary, scan, analog
Number of Pages: 176
Published: 1999-10-31
List price: $219.00
ISBN-10: 0792386868
ISBN-13: 9780792386865

The Mixed-Signal Boundary-Scan Test Bus is the natural complement to the widely used Boundary-Scan IEEE Std. 1149.1, commonly known as JTAG. This new Mixed-Signal standard is called IEEE Standard 1149.4 and is mainly dedicated to the manufacturing test of analog and mixed-signal boards. But like the IEEE 1149.1 it can be used for many other purposes: the test buses and their digital control form a very general `analog data highway’. Increasingly, mixed-signal boards are gaining complexity, making their testing process extremely challenging. At the same time, IC complexity and technology

Authors:Joseph Glaz, N. Balakrishna,
Publisher: Birkhäuser Bosto
Keywords: statistics, technology, industry, applications, scan
Number of Pages: 352
Published: 1999-09-01
List price: $129.00
ISBN-10: 081764041X
ISBN-13: 9780817640415

Scan statistics are used in many areas of science and technology to analyze the occurrence of observed clusters of events in time and space. The goal is to determine whether an observed cluster of events occurred by chance if it is assumed that the observed events follow a specified probability model. "Scan Statistics" is a comprehensive, edited survey that brings together the work of leading authorities to present the most current advances in theory and methodology for this new area of statistical research and application. The chapters contain broad coverage of theory and new analytical and c

Authors:Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein
Publisher: Birkhäuser Boston
Keywords: statistics, technology, industry, methods, scan, applications
Number of Pages: 394
Published: 2009-05-28
List price: $109.00
ISBN-10: 0817647481
ISBN-13: 9780817647483

Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and appl

Authors:Joseph Glaz, Joseph Naus, Sylvan Wallenstei,
Publisher: Springer
Keywords: statistics, series, springer, scan
Number of Pages: 370
Published: 2001-08-09
List price: $119.00
ISBN-10: 038798819X
ISBN-13: 9780387988191

Applications of scan statistics have been recorded in many areas of science and technology including: geology, geography, medicine, minefield detection, molecular biology, photography, quality control and reliability theory and radio-optics.