Author: Harry Veendrick
Publisher: Springer
Keywords: asics, basics, ics, cmos, nanometer
Number of Pages: 770
Published: 2008-05-23
List price: $209.00
ISBN-10: 1402083327
ISBN-13: 9781402083327

CMOS technologies account for almost 90% of all integrated circuits (ICs). This book provides an essential introduction to nanometer CMOS ICs. The contents of this book are based upon several previous publications and editions entitled ’MOS ICs’ and ’Deep-Submicron CMOS ICs’. Nanometer CMOS ICs is fully updated and is not just a copy-and-paste of previous material. It includes aspects of scaling up to and beyond 32nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of

Author: Ernst Meyer
Publisher: World Scientific Publishing Company
Keywords: scale, nanometer, rheology, friction, nanoscience
Number of Pages: 392
Published: 2002-08
List price: $54.00
ISBN-10: 9812380620
ISBN-13: 9789812380623

Friction force microscopy is an important analytical tool in the field of tribology on the nanometer-scale. The contact area between the probing tip and the sample is reduced to some square nanometers, corresponding to the ideal of a single asperity contact. Traditional concepts, such as friction coefficients, adhesion and elasticity and stick-slip are re-examined with this novel technique. New concepts based upon classical and quantum mehanics are investigated.

Authors:Mohamed Elgamel, Magdy A. Bayoumi,
Publisher: Springer
Keywords: technologies, nanometer, optimization, noise, interconnect
Number of Pages: 156
Published: 2005-11-21
List price: $129.00
ISBN-10: 0387258701
ISBN-13: 9780387258706

Presents a range of CAD algorithms and techniques for synthesizing and optimizing interconnect Provides insight & intuition into layout analysis and optimization for interconnect in high speed, high complexity integrated circuits

Authors:J. Bhasker, Rakesh Chadha,
Publisher: Springer
Keywords: practical, approach, designs, nanometer, timing, analysis, static
Number of Pages: 572
Published: 2009-04-17
List price: $209.00
ISBN-10: 0387938192
ISBN-13: 9780387938196

The book covers topics such as cell timing and power modeling; interconnect modeling and analysis, delay calculation, crosstalk, noise and the chip timing verification using static timing analysis. For each of these topics, the book provides a theoretical background as well as detailed examples to elaborate the concepts. The static timing analysis topics covered start from verification of simple blocks useful for a beginner to this field. The topics then extend to complex nanometer designs with in-depth treatment of concepts such as modeling of on-chip variation, clock gating, half-cycle path

Authors:Siva G. Narendra, Anantha P. Chandrakasan,
Publisher: Springer
Keywords: circuits, systems, integrated, technologies, nanometer, cmos, leakage
Number of Pages: 317
Published: 2005-11-17
List price: $149.00
ISBN-10: 0387257373
ISBN-13: 9780387257372

Covers in detail promising solutions at the device, circuit, and architecture levels of abstraction after first explaining the sensitivity of the various MOS leakage sources to these conditions from the first principles. Also treated are the resulting effects so the reader understands the effectiveness of leakage power reduction solutions under these different conditions. Case studies supply real-world examples that reap the benefits of leakage power reduction solutions as the book highlights different device design choices that exist to mitigate increases in the leakage components as tech

Author: Nisar Ahmed
Publisher: Springer
Keywords: frontiers, electronic, testing, tests, delay, technology, designs, quality, nanometer
Number of Pages: 281
Published: 2007-12-20
List price: $129.00
ISBN-10: 0387764860
ISBN-13: 9780387764863

Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

Authors:Ahmed A. Youssef, James W. Haslett,
Publisher: Springer
Keywords: circuits, signal, processing, analog, applications, cmos, rfics, mobile, nanometer
Number of Pages: 200
Published: 2010-06-09
List price: $129.00
ISBN-10: 904818603X
ISBN-13: 9789048186037

Nanometer CMOS RFICs for Mobile TV Applications focuses on how to break the trade-off between power consumption and performance (linearity and noise figure) by optimizing the mobile TV front-end dynamic range in three hierarchical levels: the intrinsic MOSFET level, the circuit level, and the architectural level. It begins by discussing the fundamental concepts of MOSFET dynamic range, including nonlinearity and noise. It then moves to the circuit level introducing the challenges associated with designing wide-dynamic range, variable-gain, broadband low-noise amplifiers (LNAs). The book gives