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The Spectroscopy of Semiconductors, Volume 36 (Semiconductors and Semimetals)

Authors:Christopher L. Littler, David G. Seiler
Publisher: Academic Press
Keywords: semiconductors, semimetals, volume, spectroscopy
Number of Pages: 435
Published: 1992-07-21
List price: $215.00
ISBN-10: 0127521364
ISBN-13: 9780127521367

Book Description:

Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as GaAs, InSb, Hg1-xCdxTe and MBE grown structures based upon GaAs/AlGaAs materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today’s semiconductor structures.

Key Features
* Discusses the latest advances in spectroscopic techniques used to investigate bulk and artificially structured semiconductors
* Features detailed review articles which cover basic principles
* Highlights specific applications such as the use of laser spectroscopy for the characterization of GaAs quantum well structures


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