Author: R. S Sirohi
Publisher: Wiley
Keywords: measurements, mechanical
Published: 1991
List price: unknow
ISBN-10: 8122403832
ISBN-13: 9788122403831

Details techniques for measuring such process variables as pressures, flow and temperature. Describes the generalized performance characteristics of instruments as well as error analysis. This edition features a chapter on fiber-optics in measurements which covers the fundamental physics of light progagation in fibers, fiber types plus a number of FO sensors and their application areas.

Author: Sirohi
Publisher: CRC Press
Keywords: engineering, science, optical, metrology, speckle
Number of Pages: 568
Published: 1993-05-20
List price: $299.95
ISBN-10: 0824789326
ISBN-13: 9780824789329

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface

Author: Rajpal S. Sirohi
Publisher: CRC Press
Keywords: optical, science, engineering, second, wholefield, methods, measurement, techniques
Number of Pages: 316
Published: 2009-06-26
List price: $139.95
ISBN-10: 1574446975
ISBN-13: 9781574446975

Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It als