Author: Enrique del Castillo
Publisher: Springer
Keywords: approach, statistical, optimization, process
Number of Pages: 462
Published: 2007-08-06
List price: $124.00
ISBN-10: 0387714340
ISBN-13: 9780387714349

PROCESS OPTIMIZATION: A Statistical Approach is a textbook for a course in Response Surface Methodology and experimental optimization techniques for industrial production processes and other "noisy" systems where the main emphasis is process optimization. The book can also be used as a reference text by Industrial, Quality and Process Engineers and Applied Statisticians working in industry, in particular, in semiconductor/electronics manufacturing and in biotech manufacturing industries. The major features of PROCESS OPTIMIZATION: A Statistical Approach are: It provides a complete exposition

Author: Enrique Castillo
Publisher: CRC Press
Keywords: applied, mathematics, engineering, science, equations, modelling, functional
Number of Pages: 352
Published: 1992-05-27
List price: $189.95
ISBN-10: 082478717X
ISBN-13: 9780824787172

Provides engineers and applied scientists with some selected results of functional equations and their applications, with the intention of changing the way they think about mathematical modelling. Many of the proofs are simplified or omitted, so as not to bore or confuse engineers. Functional equati

Author: Enrique Castillo
Publisher: Elsevier Applied Science
Keywords: learning, uncertainty, systems, expert
Number of Pages: 331
Published: 1991
List price: unknow
ISBN-10: 0945824335
ISBN-13: 9780945824336

A general introduction to expert systems dealing with uncertainty and learning methods; describing the most common methods and pointing out their deficiencies.

Authors:Bianca M. Colosimo, Enrique del Castillo,
Publisher: Chapman and Hall/CRC
Keywords: optimization, control, monitoring, process, bayesian
Number of Pages: 352
Published: 2006-11-10
List price: $99.95
ISBN-10: 1584885440
ISBN-13: 9781584885443

Although there are many Bayesian statistical books that focus on biostatistics and economics, there are few that address the problems faced by engineers. Bayesian Process Monitoring, Control and Optimization resolves this need, showing you how to oversee, adjust, and optimize industrial processes.Bridging the gap between application and development, this reference adopts Bayesian approaches for actual industrial practices. Divided into four parts, it begins with an introduction that discusses inferential problems and presents modern methods in Bayesian computation. The next part explains stati

Authors:Enrique Castillo, Jose M. Gutierrez, Ali S. Hadi,
Publisher: Springer
Keywords: monographs, computer, science, models, network, systems, probabilistic, expert
Number of Pages: 605
Published: 1996-12-13
List price: $99.00
ISBN-10: 0387948589
ISBN-13: 9780387948584

Artificial intelligence and expert systems have seen a great deal of research in recent years, much of which has been devoted to methods for incorporating uncertainty into models. This book is devoted to providing a thorough and up-to-date survey of this field for researchers and students.

Authors:James Moyne, Enrique del Castillo, Arnon M. Hurwit
Publisher: CRC Pre
Keywords: manufacturing, semiconductor, control
Number of Pages: 368
Published: 2000-11-30
List price: $139.95
ISBN-10: 0849311780
ISBN-13: 9780849311789

Run-to-run (R2R) control is cutting-edge technology that allows modification of a product recipe between machine "runs," thereby minimizing process drift, shift, and variability-and with them, costs. Its effectiveness has been demonstrated in a variety of processes, such as vapor phase epitaxy, lithography, and chemical mechanical planarization. The only barrier to the semiconductor industry’s widespread adoption of this highly effective process control is a lack of understanding of the technology. Run to Run Control in Semiconductor Manufacturing overcomes that barrier by offering in-de

Authors:Barry C. Arnold, Enrique Castillo, Jose M. Sarabia,
Publisher: Springer
Keywords: series, statistics, springer, models, specification, statistical, conditional
Number of Pages: 436
Published: 1999-10-14
List price: $129.00
ISBN-10: 0387987614
ISBN-13: 9780387987613

The concept of conditional specification of distributions is not new but, except in normal families, it has not been well developed in the literature. Computational difficulties undoubtedly hindered or discouraged developments in this direction. However, such roadblocks are of dimished importance today. Questions of compatibility of conditional and marginal specifications of distributions are of fundamental importance in modeling scenarios. Models with conditionals in exponential families are particularly tractable and provide useful models in a broad variety of settings.