Author: Edward Reimer Brandt
Publisher: Clearfield
Keywords: german, speaking, ancestors, hungary, research, information, addresses, hungarian, archives, supplementary, contents
Number of Pages: 88
Published: 2009-06-01
List price: $19.50
ISBN-10: 0806346078
ISBN-13: 9780806346076

The starting point for researching German-speaking ancestors living in Hungary during the early part of this century, the book at hand contains up-to-date addresses of some 70 Hungarian archives--national, county, religious, and special--as well as a listing of genealogical holdings of various archives as noted in the Guide to the Archives of Hungary published by the Archival Board of the Hungarian Ministry of Culture in 1976. Also included are various maps showing the changed county names and boundaries of pre- and post-World War I Hungary, statistical tables on the location of Germans

Authors:Doris Reimer, Der Verleger Georg Andreas Reimer,
Publisher: Walter de Gruyter
Keywords: german, kalkul, amp, passion
Number of Pages: 460
Published: 1999-10
List price: $172.00
ISBN-10: 3110166437
ISBN-13: 9783110166439

This is the history of the publishing house of Georg Andreas Reimer (1776-1842), the most important publisher of the German Romantics, a friend of Friedrich Schleiermacher’s, Ernst Moritz Arndt’s and Caspar David Friedrich’s. At the same time, it is the history of one of Germany’s most important educational and academic publishing houses in the first half of the 19th century. The first part of the account is largely biographical and traces the early years of the Berlin publishing house up to the Wars of Liberation and the reactions against the demagogues around 1820. Du

Author: S.R. Reimer
Publisher: Pontifical Institute of Mediaeval Studies
Keywords: texts, studies, herebert, william, works
Number of Pages: 173
Published: 1987-01-01
List price: $39.95
ISBN-10: 0888440812
ISBN-13: 9780888440815

Author: Mavis Reimer
Publisher: The Scarecrow Press, Inc.
Keywords: montgomery, anne, gables, responses, critical, little, tale, simple
Number of Pages: 208
Published: 2003-07-01
List price: $39.05
ISBN-10: 0810839857
ISBN-13: 9780810839854

Here is a compilation of the best critical essays on this enduring classic. Selections focus on the many perspectives from which "Anne of Green Gables "is viewed. Is it children’s literature, or does it fit a different area of literary scholarship? Each of the articles breaks new ground in the literary criticism of Montgomery’s book. Also included is a comprehensive bibliographic guide to the research and criticism of Anne, from the earliest reviews to the most recent essays. Contributors: Temma R. Berg, Susan Drain, Carol Gay, Nancy Huse, Susan Jackson, Eve Kornfeld, T.D. MacLulic

Author: Albert Reimer
Publisher: Nova Science Publishers
Keywords: world, physics, horizons, trends, gravity, research, quantum
Number of Pages: 362
Published: 2006-03-30
List price: $210.00
ISBN-10: 1594543240
ISBN-13: 9781594543241

Author: Kathie Reimer
Publisher: B&H Espanol
Keywords: ninos, sus, biblia, presentar, maneras
Number of Pages: 320
Published: 2005-05-01
List price: $12.99
ISBN-10: 0805430776
ISBN-13: 9780805430776

This book is designed to motivate parents to present the Lord’s Word to their own children. Este libro se ha deseñado para motivar a los padres a que presenten la Palabra de Dios a sus propios hijos.  

Author: Ludwig Reimer
Publisher: SPIE Press
Keywords: tutorial, vol, text, tt12, texts, engineering, optical, spie, low, formation, voltage, scanning, microscopy, electron, image
Number of Pages: 117
Published: 1993-02-01
List price: $46.00
ISBN-10: 0819412066
ISBN-13: 9780819412065

While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations and design on electron-probe formation; the effect of elastic and inelastic scattering processes on electron diffusion and electron range; charging and radiation damage effects; the dependence of SE yield and the backscattering coefficient on electron energy, surface tilt, and material as well as the angular and en